Serving  Our Guest    
ALL CATEGORIES   Semiconductor Mfg Eq   Metrology Eq   Film Thickness    View LISTINGS    Search-by-Specs   
View All Offers Under

Ellipsometers


» Switch Major Category
Click an item's ID# below for its full specifications , or:

List other sub-categories under Film Thickness TestersList other sub-categories under Film Thickness Testers

Show other product types under Film Thickness TestersShow other product types under Film Thickness Testers


  • To sort on a column, click the column head; click it again to reverse the sort.  View measures in specified units, or  click to change units of measureMetric  click to change units of measureUS
  • Click Compare Items to compare the full details of up to 5 items.
  • Hide photos, compress data table
Item IDPhotoItem DescriptionWafer Size RangeIlumntn SorcMicro Spot OptScanning StageWafer Mapping#PriceNotes
MakeModelMinMax
$
39958
Gaertner L2W16E.1550150 mmMulti-wavlengthYES1
45435
Gaertner L116BHeNe Laser1 F*
58212
Rudolph Research AUTO EL RE-350150 mm1
86164
Rudolph Technologies AUTO EL150 mmHeNe Laser1 F*

NOTE:
   photo available
   reference document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Ellipsometers:
Gaertner, Rudolph Research, Rudolph Technologies, Inc.