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	View All Offers Under Wafer Manufacturing Metrology Equipment » Switch Major Category		Click an item's ID# below for its full specifications , or: Group Offers into sub-categories under Wafer Manufacturing Metrology Equipment List all 7 product types under Wafer Manufacturing Metrology Equipment

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	Item ID  Short Description Product Type / Details # Price Note Make Model   $   99573 CDE RESMAP 463-OC 4 & 6 Point Probes in Resistivity Testers 1 F*   CREATIVE DESIGN ENGINEERING RESMAP FOUR POINT PROBE Four Point Probe 26911 Philips DCD 120 Xray Diffractometers in Wafer Manufacturing Metrology Equipment 1 F*   PHILIPS DOUBLE CRYSTAL DIFFRACTOMETER Double Crystal Diffractometer Double Crystal Diffractometer optimized for fast rocking curve analysis of pseudomorphic epitaxial layer structures. 46035 Philips XPERT HR2 Xray Diffractometers in Wafer Manufacturing Metrology Equipment 1 F*   PHILIPS HIGH RESOLUTION X-RAY DIFFRACTOMETER High Resolution X-Ray Diffractometer Software, Firmware updated in 2004 Generator upgraded in 2000

*  Vendor Role: Mfr is Manufacturer; Sup is Supplier/Distributor; OEM is Original Equipment Manufacturer
NOTE:
   when photo available
   when document attached
  F* if the item is specially featured
  N* if the item is newly added, and/or
  R* if the item's price is recently reduced.

Items from the following manufacturers are offered under Wafer Manufacturing Metrology Equipment: CDE, Philips