|Other Information ||Features|
- C-V measurement for performing doping profile of wafers.
- C-V characterization and sorting of varactor diodes.
- Capacitance testing of rf mixer and switching diodes.
- Testing capacitors with an applied DC bias for incoming inspection.
- Measurement Time: 10ms/20ms/30ms
- Measurement Accuracy: 0.1% (20ms)
- Internal DC Bias: 0 to +/-38V, 0.1% programmable sweep
- Measurement Range: 0.00001pF to 1280pF