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Metrology Equipment

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4 & 6 Point Probes in Resistivity Testers (no items)

Atomic Absorption in Spectrophotometers (no items)

Automatic Wafer Inspection Tools in Microscope Inspection Tools (no items)

Bulbs in Microscope Parts and Accessories (no items)

Camera Lenses in Microscope Parts and Accessories (no items)

Cameras and Controllers in Microscopes (3)

CD Measurement - Other in Critical Dimension Measurement Equipment (no items)

Condensers in Microscope Parts and Accessories (no items)

Critical Dimension Scanning Electron Microscopes in Critical Dimension Measurement Equipment (no items)

Cut-Off Saws in Sample Preparation Equipment (4)

CV Plotters in Metrology Equipment (no items)

Ellipsometers in Film Thickness Testers (4)

Eyepieces in Microscope Parts and Accessories (no items)

Fiber Optic Bundles in Fiber Optic Illuminators (no items)

Fiber Optic Light Sources in Fiber Optic Illuminators (8)

Film Thickness Testers - Other in Film Thickness Testers (no items)

Focused Ion Beam Tools in Electron Microscopy (no items)

FT-IR Spectrometers in Spectrometers (1)

FT-IR Spectrophotometers in Spectrophotometers (no items)

Illuminators - Other in Illuminators, Microscope (no items)

Implant Monitors in Metrology Equipment (no items)

Inverted Microscopes in Light Microscopes (1)

Mass Spectrometers in Spectrometers (no items)

Measuring Microscopes in Microscopes (6)

Metrology Equipment - Other in Metrology Equipment (no items)

Microscopes - Other in Microscopes (6)

Microspectrophotometers in Spectrophotometers (no items)

Mounting Press in Sample Preparation Equipment (no items)

Non-Contact Resistivity Testers in Resistivity Testers (no items)

Nosepieces in Microscope Parts and Accessories (no items)

Nuclear Magnetic Resonance Spectrometers in Spectrometers (no items)

Objective Lenses in Microscope Parts and Accessories (1)

Optical CD Measurement in Critical Dimension Measurement Equipment (1)

Optical Heads in Microscope Parts and Accessories (no items)

Other Items in Microscopes (no items)

Overlay Registration in Critical Dimension Measurement Equipment (no items)

Parts and Accessories - Other in Microscope Parts and Accessories (20)

Patterned Wafer Inspection in Surface Inspection (1)

Polishing & Grinding Sample Prep Equipment in Sample Preparation Equipment (1)

Polishing Equipment - Other in Sample Preparation Equipment (no items)

Profilometers in Film Thickness Testers (2)

Reticles in Microscope Parts and Accessories (no items)

Sample Coaters in Sample Preparation Equipment (2)

Sample Preparation - Other in Sample Preparation Equipment (4)

Scanning Electron Microscopes in Electron Microscopy (2)

Spectrometers - Other in Spectrometers (1)

Spreading Resistance Probe in Resistivity Testers (no items)

Stage Micrometers in Microscope Parts and Accessories (no items)

Stages in Microscope Parts and Accessories (no items)

Stands in Microscope Parts and Accessories (20)

Stereo Microscopes in Light Microscopes (39)

Stress Measurement Equipment in Metrology Equipment (no items)

Transmission Electron Microscopes in Electron Microscopy (no items)

Unpatterned Wafer Inspection in Surface Inspection (no items)

Upright Microscopes in Light Microscopes (25)

UV-Visible Spectrophotometers in Spectrophotometers (1)

Wafer Inspection Microscopes in Light Microscopes (6)

Xray Fluorescence Spectrometers in Spectrometers (2)

Items from the following manufacturers are offered under Metrology Equipment:
American Optical, Anatech Ltd, ATM GmbH, Bausch & Lomb, Inc, Bausch and Lomb, Buehler, Carl Zeiss, CPS, Dage-MTI, Denton, Diagnostic Instruments, Dolan Jenner, Fostec, Gaertner, Gatan, Karl Storz, KLA-Tencor, Leco, Leica, Leica, Leitz, McPherson, Melles Griot, Microspec, Mitutoyo, Nanometrics, Nicolet, Nikon, Olympus, Reichert Inc, Reichert-Jung, Rigaku, Rudolph Research, Rudolph Technologies, Inc., Schott Fostec, Semprex, Spectronic Unicam, Thermo Electron, Veeco Instruments, Vision Engineering, Volpi, Well, Wild, Zeiss

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