KLA-TENCOR PATTERNED WAFER CONTAMINATION ANALYZER
Patterned Wafer Contamination Analyzer
- Detects defects as small as 0.15 µm, while defects below 0.2 µm can be detected on many process levels, including nitride, oxide, polysilicon and TEOS films
- Capable of measuring defects on unpatterned wafers
- Capable of measuring wafers from 4” to 8”
- High sensitivity on after-etch and high topography applications
- Circular input polarization enhances sensitivity and defect capture on post-CMP and other post-deposited layers
1 unit @ Best Price
MAKE: KLA-Tencor
MODEL: 7700
CATEGORY: Patterned Wafer Inspection
SPECS
| Manufacturer | KLA-Tencor |
| Model | 7700 |
| Description | Patterned Wafer Contamination Analyzer |
| Cassette to Cassette | YES |
| Condition | Excellent |
S&H
Our standard procedure is to service the equipment as orders are placed. Lead times can vary depending on the item.
Domestic and International shipments: Ex Works, Scotia, NY. All freight cost estimates are for dock to dock service only.
Any additional services, i.e. lift-gate, inside or residential delivery, must be requested at the time of sale and will be billed accordingly.
CBI is not responsible for any damage incurred during shipment. It is the buyer's responsibility to inspect packages for damage and to note any damage on bill of lading.
Please feel free to call us with any questions. (Phone: 518.346.8347, 844-833-8347, Fax: 518.381.9578).
Payment
We offer terms of net 30 days to all companies that have established credit with Capovani Brothers Inc. and have paid within terms.
All federal, state, local governments and their agencies, as well as institutions of higher learning automatically receive terms.
All other sales, including foreign sales, are prepayment only.
MasterCard, VISA, Discover and AMEX are accepted at sellers discretion.
International Terms and Conditions