Semiconductor Metrology Tools

  1. DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Other Metrology Equipment

    DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Atomic Force Microscope AFMScanning Probe Microscope SPM

    Stage size: 300mm

    Accessories:

    • Stage Controller: NanoScope Model 5000C-1
    • Scanning Probe Microscope Controller: NanoScope IIIA
    • Vibration Isolation Table and Acoustic Enclosure

    Make: Digital Instruments

    Model: Nanoscope IIIA

    1 unit @ Best Price