Other Metrology Equipment
DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA
Atomic Force Microscope AFMScanning Probe Microscope SPM
Stage size: 300mm
Accessories:
- Stage Controller: NanoScope Model 5000C-1
- Scanning Probe Microscope Controller: NanoScope IIIA
- Vibration Isolation Table and Acoustic Enclosure