Features
C-V measurement for performing doping profile of wafers.
C-V characterization and sorting of varactor diodes.
Capacitance testing of rf mixer and switching diodes.
Testing capacitors with an applied DC bias for incoming inspection.
Measurement Time: 10ms/20ms/30ms
Measurement Accuracy: 0.1% (20ms)
Internal DC Bias: 0 to +/-38V, 0.1% programmable sweep
Measurement Range: 0.00001pF to 1280pF
https://www.keysight.com/us/en/support/4279A/1mhz-cv-meter.html
