Semiconductor Metrology Equipment

  5. DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Other Metrology Equipment

    DIGITAL INSTRUMENTS / VEECO ATOMIC FORCE MICROSCOPE NANOSCOPE IIIA

    Atomic Force Microscope AFMScanning Probe Microscope SPM

    Stage size: 300mm

    Accessories:

    • Stage Controller: NanoScope Model 5000C-1
    • Scanning Probe Microscope Controller: NanoScope IIIA
    • Vibration Isolation Table and Acoustic Enclosure

    Make: Digital Instruments

    Model: Nanoscope IIIA

    1 unit @ Best Price

    Scotia, NY US

    Item 106265

  6. NANOMETRICS CRITICAL DIMENSION COMPUTER

    Optical CD Measurement

    NANOMETRICS CRITICAL DIMENSION COMPUTER

    Critical Dimension Computer Large memory digital computer calculates line widths and provides statistics on in process wafer and photomasks.

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